Cambridge, MA, United States of America

Dmitro Jaroslau Martynowych

This inventor holds 1 USPTO granted patent. Top assignee: The Mitre Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dmitro Jaroslau Martynowych. Retrieved from https://idiyas.com/inventor/dmitro-jaroslau-martynowych

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Dmitro Jaroslau Martynowych and Magnetic Imaging with Diamond Sensors.

Introduction

Dmitro Jaroslau Martynowych is an inventor associated with Cambridge, Massachusetts. His patent work concerns using nitrogen-vacancy centers in diamond to image magnetic fields generated by integrated circuits.

Latest Patents

Martynowych is credited with 1 patent: “Digital Lock-In for Magnetic Imaging with Nitrogen Vacancy Centers in Diamonds.” The invention describes systems and methods for measuring integrated-circuit activity using the spatial resolution of optically detected magnetic resonance in nitrogen-vacancy centers.

A quantum diamond microscope can capture images of fluorescence from the centers as an external microwave field changes. When an integrated circuit is placed next to the diamond, its magnetic field affects the fluorescence. Measuring those changes can produce a map of the circuit’s magnetic field and help reveal its activity.

Career Highlights

Martynowych is associated with The MITRE Corporation. His patent highlights an application of quantum sensing to integrated-circuit analysis, using diamond-based magnetic imaging to observe device activity.

Collaborations

David Allen Hopper and Sean Mitchell Oliver are identified as Martynowych’s coworkers. Their names are also associated with the collaborative research context surrounding the patent.

Conclusion

Dmitro Jaroslau Martynowych’s patent applies nitrogen-vacancy diamond sensing to magnetic imaging of integrated circuits, illustrating how quantum measurement techniques can support device analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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