Company Filing History:
Years Active: 2024
Title: Dmitri Starodub: Innovator in Inspection Technology
Introduction
Dmitri Starodub is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of inspection technology, particularly through his innovative patent. His work is characterized by a focus on enhancing inspection systems to improve defect detection.
Latest Patents
Dmitri holds a patent titled "Inspection with Previous Step Subtraction." This patent describes an inspection system that generates first-step images of multiple sample regions after a first process step. It also generates second-step images of the sample regions after a second process step, which modifies the sample in at least one of the regions. The system identifies one of the sample regions as a test region and the remaining regions as comparison regions. The second-step image of the test region serves as a test image, while the second-step images of the comparison regions are comparison images. The system generates a multi-step difference image by subtracting a combination of at least one of the second-step comparison images and at least two of the first-step images from the test image. This innovative approach allows for the identification of defects in the test region associated with the second process step based on the multi-step difference image. Dmitri has 1 patent to his name.
Career Highlights
Dmitri is currently employed at Kla Corporation, where he continues to develop and refine inspection technologies. His work at Kla Corporation has positioned him as a key player in the advancement of inspection systems.
Collaborations
Dmitri collaborates with talented individuals such as Robert M Danen and Sangbong Park. Their combined expertise contributes to the innovative environment at Kla Corporation.
Conclusion
Dmitri Starodub's contributions to inspection technology through his patent demonstrate his commitment to innovation and excellence in his field. His work continues to influence the industry and improve defect detection processes.