Dresden, Belgium

Dirk Steinike

This inventor holds 1 USPTO granted patent. Top assignee: Flir Systems, Incorporated. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dirk Steinike. Retrieved from https://idiyas.com/inventor/dirk-steinike

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: The Innovations of Dirk Steinike

Introduction

Dirk Steinike is a notable inventor based in Dresden, Germany. He has made significant contributions to the field of technology, particularly through his innovative work at Flir Systems, Incorporated. With a focus on developing advanced detection systems, Steinike has secured his place in the world of patents.

Latest Patents

Steinike holds a patent for a detector, showcasing his expertise in creating solutions that enhance detection capabilities. This patent reflects his commitment to innovation and the advancement of technology in his field.

Career Highlights

Throughout his career, Dirk Steinike has demonstrated a strong dedication to his work at Flir Systems, Incorporated. His role in the company has allowed him to explore new ideas and push the boundaries of what is possible in detection technology. With 1 patent to his name, he has established himself as a valuable asset to the team.

Collaborations

Steinike has worked alongside talented colleagues such as Steffen De Muynck and Jonas Tiersen. Their collaborative efforts have contributed to the success of various projects within the company, fostering an environment of innovation and creativity.

Conclusion

Dirk Steinike's contributions to the field of detection technology are commendable. His patent and collaborative work at Flir Systems, Incorporated highlight his innovative spirit and dedication to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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