San Francisco, CA, United States of America

Dirk Beyer

This inventor holds 2 USPTO granted patents. Top assignee: Neustar, Inc.. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dirk Beyer. Retrieved from https://idiyas.com/inventor/dirk-beyer-3hg9a1wi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024-2026

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2 patents (USPTO):Explore Patents

Title: Dirk Beyer: Innovator in Automated Learning Models

Introduction

Dirk Beyer is a notable inventor based in San Francisco, CA. He has made significant contributions to the field of automated learning and model development. With a total of 2 patents, his work focuses on creating systems that enhance understanding of domain theories.

Latest Patents

Dirk Beyer's latest patents include a groundbreaking system for automated learning of models for domain theories. This computer-implemented process involves identifying a schema that defines potential causal elements of specific behaviors. The system determines one or more concepts and sub-concepts associated with logical relationships. Multiple models are generated from these concepts and sub-concepts, which can be calibrated using real-world data. Ultimately, an optimal model is selected from a range of calibrated models.

Career Highlights

Dirk currently works at Neustar, Inc., where he applies his expertise in developing innovative solutions. His work has been instrumental in advancing the understanding of complex systems through automated learning.

Collaborations

Dirk collaborates with Robert Stratton, leveraging their combined knowledge to push the boundaries of technology and innovation.

Conclusion

Dirk Beyer stands out as an influential inventor in the realm of automated learning models. His contributions continue to shape the future of technology and innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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