Tucheng, Taiwan

Ding-Yuan Jheng

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: High Power Lighting Corp.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ding-Yuan Jheng. Retrieved from https://idiyas.com/inventor/ding-yuan-jheng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2010

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Ding-Yuan Jheng and LED Module Testing

Introduction

Ding-Yuan Jheng is an inventor associated with Tucheng, Taiwan, and High Power Lighting Corp. His patent work concerns testing LED modules and evaluating the photo-electrical properties of their individual light-emitting diodes.

Latest Patents

The provided information lists one patent for Jheng: “Testing Method for LED Module.” The method places an integration detector above an LED module containing multiple light-emitting diodes and electrically connects the diodes to conductive terminals. An electronic signal connector changes the ON/OFF states of the signals, while the detector measures the photo-electrical properties of each diode. This approach supports testing the LEDs individually within the module.

Career Highlights

Jheng’s listed patent reflects work on LED testing methods and associated electrical connections. The supplied data identifies him with High Power Lighting Corp. and records 1 patent.

Collaborations

Chih-Lung Wu and Ming-Chang Wu are identified as Jheng’s coworkers. The provided information does not specify their roles in the patent or describe particular collaborative projects.

Conclusion

Ding-Yuan Jheng’s recorded invention focuses on a method for testing LED modules by controlling electrical signals and measuring each diode’s photo-electrical properties.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…