Richardson, TX, United States of America

Dina Rodriguez

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2018.


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2018

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Dina Rodriguez

Introduction

Dina Rodriguez is a notable inventor based in Richardson, Texas. She has made significant contributions to the field of semiconductor technology. Her work has led to advancements that enhance the efficiency and effectiveness of semiconductor manufacturing processes.

Latest Patents

Dina holds 1 patent for her invention titled "Methods and apparatus for alignment marks." This patent describes a method that includes growing an oxide layer on the topside of a semiconductor wafer using a local oxidation of silicon (LOCOS) process. The process involves forming a photoresist pattern with an alignment opening on the oxide layer, etching the oxide layer to create a trench, and depositing a dielectric layer. The method further includes performing an anisotropic plasma etch and growing an alignment mark oxide layer, culminating in the etching and removal of the oxide layers.

Career Highlights

Dina Rodriguez is currently employed at Texas Instruments Corporation, where she applies her expertise in semiconductor technology. Her innovative approach has contributed to the company's reputation as a leader in the electronics industry.

Collaborations

Throughout her career, Dina has collaborated with talented individuals such as Prakash Dalpatbhai Dev and Billy Alan Wofford. These collaborations have fostered a creative environment that encourages innovation and problem-solving.

Conclusion

Dina Rodriguez exemplifies the spirit of innovation in the semiconductor industry. Her contributions through her patent and work at Texas Instruments Corporation highlight her role as a key player in advancing technology.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…