Kempten, Germany

Dieter Waldhauser

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Other. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dieter Waldhauser. Retrieved from https://idiyas.com/inventor/dieter-waldhauser

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:

goldMedal1 out of 834,601 
Other
 patents

Years Active: 2002

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Dieter Waldhauser: Innovator in Sample Measurement Technology

Introduction

Dieter Waldhauser is a notable inventor based in Kempten, Germany. He has made significant contributions to the field of measurement technology, particularly in the area of sample collection.

Latest Patents

Waldhauser holds 1 patent for an "Apparatus for and method of taking a predeterminable volume of a sample of medium." This invention showcases his expertise in developing precise measurement tools that are essential in various industrial applications.

Career Highlights

Throughout his career, Waldhauser has worked with prominent companies, including Endress + Hauser Wetzer GmbH + Co. KG. His experience in these organizations has allowed him to refine his skills and contribute to innovative projects in measurement technology.

Collaborations

Waldhauser has collaborated with notable colleagues such as Hubert Lebski and Wilhelm Schneider. These partnerships have fostered a creative environment that has led to advancements in their respective fields.

Conclusion

Dieter Waldhauser's contributions to measurement technology through his patent and collaborations highlight his role as an influential inventor. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…