Moosburg, Germany

Dieter K Horak

This inventor holds 1 USPTO granted patent. Top assignee: Kontron Holding Ag. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dieter K Horak. Retrieved from https://idiyas.com/inventor/dieter-k-horak

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: Dieter K Horak: Innovator in Logic Analysis

Introduction

Dieter K Horak is a notable inventor based in Moosburg, Germany. He has made significant contributions to the field of logic analysis, particularly with his innovative patent that addresses the challenges of measuring logic signals from multiple targets.

Latest Patents

Horak holds a patent for a logic analyzer designed to measure logic signals delivered by various targets that are not time-correlated. This invention incorporates acquisition modules that can connect to associated targets or data sources. The modules utilize different circuit arrangements to select between the system's internal constant-frequency clock or an external target-generated clock signal for sampling. This allows for the synchronization of time-uncorrelated data signals, which are then compared with predetermined patterns to indicate coincidences.

Career Highlights

Dieter K Horak has established himself as a key figure in the field of logic analysis through his work at Kontron Holding AG. His expertise in developing advanced measurement tools has contributed to the company's reputation for innovation in technology.

Collaborations

Horak has collaborated with Rudolf Wieczorek, working together to enhance the capabilities of logic analyzers and improve their functionality in various applications.

Conclusion

Dieter K Horak's contributions to the field of logic analysis through his innovative patent demonstrate his commitment to advancing technology. His work continues to influence the development of measurement tools in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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