This inventor holds 2 USPTO granted patents. Top assignee: University of California. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: Dieter H Schneider: Innovator in Mass Spectroscopy
Introduction
Dieter H Schneider is a prominent inventor based in Livermore, CA (US). He has made significant contributions to the field of mass spectroscopy, holding 2 patents that showcase his innovative approach to surface analysis.
Latest Patents
One of his latest patents is for a device titled "Highly Charged Ion Secondary Ion Mass Spectroscopy." This invention utilizes slow, highly charged ions produced in an electron beam ion trap, allowing for ultra-sensitive surface analysis and high spatial resolution simultaneously. The spectrometer features an ion source that generates a primary ion beam directed at a target surface, a mass analyzer, and a microchannel plate detector for secondary ions sputtered from the target surface. The high secondary ion yield enables coincidence counting, allowing for the correlation of specific molecular species.
Another notable patent is the "Highly Charged Ion Based Time of Flight Emission Microscope." This instrument enhances the surface sensitivity of static Secondary Ion Mass Spectrometry (SIMS) measurements due to the higher ionization probability of highly charged ions. The design includes slow, highly charged ions directed to the sample surface, with sputtered secondary ions and electrons passing through a specially designed objective lens to a microchannel plate detector. This microscope allows for high surface sensitivity, high spatial resolution, and the ability to gather chemical structural information.
Career Highlights
Dieter H Schneider is affiliated with the University of California, where he continues to advance research in mass spectroscopy. His work has significantly impacted the analytical techniques used in surface analysis.
Collaborations
Some of his notable coworkers include Alex V Hamza and Thomas Schenkel, who have collaborated with him on various projects related to mass spectroscopy.
Conclusion
Dieter H Schneider's innovative contributions to mass spectroscopy through his patents demonstrate his expertise and commitment to advancing analytical techniques. His work continues to influence the field and enhance our understanding of surface analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile