This inventor holds 1 USPTO granted patent. Top assignee: Zhejiang University. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Innovations of Dianrong Li in Filament Measurement Technology
Introduction
Dianrong Li is a notable inventor based in Zhejiang, China. He has made significant contributions to the field of optical measurement technology. His innovative approach focuses on the precise measurement of filament diameters using advanced techniques.
Latest Patents
Dianrong Li holds a patent titled "Method for measuring the diameter of filament diffraction fringes by calculating the frequency domain." This invention involves a systematic approach to measuring filament diameters through a diffraction optical path measurement system. The method captures diffraction fringe images and determines the optimal fringe range while considering noise from CCD sensitivity differences. By simulating electromagnetic field propagation in Fraunhofer diffraction, the filament diameter is calculated using Fourier transform techniques. The accuracy of this method reaches sub-nanometer levels, showcasing its effectiveness and simplicity.
Career Highlights
Dianrong Li is affiliated with Zhejiang University, where he continues to advance research in optical measurement technologies. His work emphasizes the importance of frequency domain calculations in achieving high measurement accuracy.
Collaborations
Dianrong Li has collaborated with notable colleagues, including Zhenghui Hu and Liuxian Ye. Their joint efforts contribute to the ongoing development of innovative measurement techniques.
Conclusion
Dianrong Li's contributions to filament measurement technology highlight the potential of frequency domain calculations in achieving precise measurements. His work not only advances scientific understanding but also paves the way for future innovations in optical measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
