Zhejiang, China

Dianrong Li

This inventor holds 1 USPTO granted patent. Top assignee: Zhejiang University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dianrong Li. Retrieved from https://idiyas.com/inventor/dianrong-li-r8ur1fj4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations of Dianrong Li in Filament Measurement Technology

Introduction

Dianrong Li is a notable inventor based in Zhejiang, China. He has made significant contributions to the field of optical measurement technology. His innovative approach focuses on the precise measurement of filament diameters using advanced techniques.

Latest Patents

Dianrong Li holds a patent titled "Method for measuring the diameter of filament diffraction fringes by calculating the frequency domain." This invention involves a systematic approach to measuring filament diameters through a diffraction optical path measurement system. The method captures diffraction fringe images and determines the optimal fringe range while considering noise from CCD sensitivity differences. By simulating electromagnetic field propagation in Fraunhofer diffraction, the filament diameter is calculated using Fourier transform techniques. The accuracy of this method reaches sub-nanometer levels, showcasing its effectiveness and simplicity.

Career Highlights

Dianrong Li is affiliated with Zhejiang University, where he continues to advance research in optical measurement technologies. His work emphasizes the importance of frequency domain calculations in achieving high measurement accuracy.

Collaborations

Dianrong Li has collaborated with notable colleagues, including Zhenghui Hu and Liuxian Ye. Their joint efforts contribute to the ongoing development of innovative measurement techniques.

Conclusion

Dianrong Li's contributions to filament measurement technology highlight the potential of frequency domain calculations in achieving precise measurements. His work not only advances scientific understanding but also paves the way for future innovations in optical measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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