This inventor holds 2 USPTO granted patents. Top assignee: Bentley Systems, Inc.. Active years: 2024-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024-2026
Title: Innovations of Dian Mo in Machine Vision-Based Techniques
Introduction
Dian Mo is an accomplished inventor based in Watertown, CT (US). He has made significant contributions to the field of structural health monitoring through his innovative patent. His work focuses on machine vision-based techniques that enhance the accuracy and effectiveness of monitoring structural integrity.
Latest Patents
Dian Mo holds a patent for "Machine vision-based techniques for non-contact structural health monitoring." This patent outlines various embodiments that integrate phase-based algorithms and template matching algorithms. These techniques enable the selection of effective machine vision algorithms for measuring responses such as displacement, strain, acceleration, and velocity under varying conditions. The patent emphasizes the use of improved template matching algorithms that provide sub-pixel accuracy. Additionally, the techniques allow for adjustments to cancel out camera vibration and video noise, facilitating the detection of defects or damage by tracking changes in displacement within an area of interest.
Career Highlights
Dian Mo is currently employed at Bentley Systems, Inc., where he continues to develop and refine his innovative techniques. His work has positioned him as a key figure in the advancement of non-contact structural health monitoring technologies.
Collaborations
Dian Mo collaborates with talented individuals such as Zheng Yi Wu and Peng Xiao. Their combined expertise contributes to the ongoing development of cutting-edge solutions in the field.
Conclusion
Dian Mo's contributions to machine vision-based techniques for structural health monitoring demonstrate his commitment to innovation and excellence. His patent reflects a significant advancement in the ability to monitor structural integrity effectively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
