Suzhou, China

Di Meng

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Suzhou Zhen Wang Optical Co., Ltd. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Di Meng. Retrieved from https://idiyas.com/inventor/di-meng-uq0gzhdf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Di Meng and His Astrophotography Invention.

Introduction

Di Meng is an inventor based in Suzhou, China. His patent work includes an invention designed to help an astrophotographic apparatus locate celestial targets and acquire images of them.

Latest Patents

Meng is associated with one patent, titled “Method and Astrophotographic Apparatus for Acquiring Images of Targets in Sky Area.” The disclosed method uses a controlled rotatable component to point an image acquisition device near a target and capture images of the surrounding sky. The images are analyzed to determine the right ascension and declination coordinates of their center, which are synchronized with the rotatable component. The apparatus then points toward the target’s celestial coordinates, captures images, and processes them.

Career Highlights

Meng’s listed patent count is 1 patent. His work is associated with Suzhou Zhen Wang Optical Co., Ltd., and focuses on coordinating image capture, celestial coordinates, and apparatus movement for astrophotography.

Collaborations

Meng’s listed coworkers include Jia Wen and Mouling Song. The available information identifies them as colleagues but does not specify their roles in the patent.

Conclusion

Di Meng’s patent describes a coordinated approach to locating celestial targets and acquiring processed astrophotographic images.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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