Bellevue, WA, United States of America

Di Guan

This inventor holds 1 USPTO granted patent. Top assignee: Microsoft Technology Licensing, LLC. Active years: 2026.


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Di Guan: Innovator in Incident Dependency Prediction

Introduction

Di Guan is a notable inventor based in Bellevue, WA (US). He has made significant contributions to the field of network incident management through his innovative patent. His work focuses on predicting responsible incidents, which is crucial for improving network reliability and efficiency.

Latest Patents

Di Guan holds a patent for a method titled "Responsible Incident Prediction." This patent describes a process for identifying and predicting the root causes of newly-occurring network incidents by analyzing historical data. The method involves identifying similar past incidents, obtaining causal dependency data, and utilizing an incident dependency prediction model to forecast potential root causes. This innovative approach enhances the ability to manage network incidents effectively.

Career Highlights

Di Guan is currently employed at Microsoft Technology Licensing, LLC, where he applies his expertise in incident prediction. His work at Microsoft has allowed him to contribute to advancements in technology and network management. With a focus on practical applications, he continues to develop solutions that address real-world challenges in the tech industry.

Collaborations

Di Guan collaborates with talented colleagues, including Yu Zhang and Tianjun Shi. Their combined efforts contribute to the innovative environment at Microsoft, fostering the development of cutting-edge technologies.

Conclusion

Di Guan's contributions to incident dependency prediction exemplify the impact of innovation in technology. His work not only enhances network management but also showcases the importance of collaboration in driving advancements in the field.

Profile summary based on public USPTO records.
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