Company Filing History:
Years Active: 2021
Title: An Insight into the Innovations of Inventor Di Cheng
Introduction
Di Cheng, an accomplished inventor based in Beijing, China, has made significant contributions to the field of defect reconstruction. His innovative methods are essential for enhancing detection accuracy in various engineering applications.
Latest Patents
Di Cheng holds a patent titled "Method for Reconstructing Defect." This method includes a detailed process that begins with establishing a database of magnetic flux leakage signals for a unit defect and acquiring the relevant signals. The procedure involves several systematic steps, including the acquisition of a target magnetic flux leakage signal, setting an initial scaling factor, and constructing a forward model for prediction. The process intricately calculates errors to refine defect detection and ultimately scales the unit defect to ascertain its final size.
Career Highlights
Di Cheng is affiliated with Tsinghua University, where he contributes his expertise to research and development in engineering and defect analysis. His work has been pivotal in advancing methodologies for non-destructive testing and inspection techniques.
Collaborations
Throughout his career, Di Cheng has collaborated with esteemed colleagues such as Songling Huang and Wei Zhao. Their collective expertise and shared vision have fostered an environment of innovation at Tsinghua University.
Conclusion
Di Cheng stands out as a prominent inventor in the realm of defect reconstruction, with his patented method contributing to better detection techniques in the engineering sector. His work, driven by collaboration and innovation, continues to impact the field positively.