The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2021
Filed:
Mar. 02, 2018
Tsinghua University, Beijing, CN;
Songling Huang, Beijing, CN;
Wei Zhao, Beijing, CN;
Lisha Peng, Beijing, CN;
Shen Wang, Beijing, CN;
Di Cheng, Beijing, CN;
Jiarui Dong, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
Abstract
A method for reconstructing a defect includes: S1, establishing a database of magnetic flux leakage signals of a unit defect and acquiring a magnetic flux leakage signal of the unit defect; S2, acquiring a target magnetic flux leakage signal; S3, initially setting a scaling factor k; S4, constructing a forward model; S5, inputting the k into the forward model and performing forward prediction according to the k to acquire a predicted magnetic flux leakage signal for the defect to be detected; S6, calculating an error between the target magnetic flux leakage signal and the predicted magnetic flux leakage signal, and determining whether the error is smaller than an error threshold ε, if yes, executing S7; otherwise, executing S5 after the k is corrected; and S7, scaling the unit defect according to the k to acquire a final size of the defect to be detected.