Shenzhen, China

Dezhou Chang

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Anker Innovations Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dezhou Chang. Retrieved from https://idiyas.com/inventor/dezhou-chang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Dezhou Chang and a Patent for Lock Control

Introduction

Dezhou Chang is an inventor based in Shenzhen, China. His patent work includes a lock-control invention addressing how a lock detects and signals its locked and unlocked states. Chang is associated with Anker Innovations Technology Co., Ltd.

Latest Patents

Chang is credited with 1 patent, titled “Control Method for Locking and Unlocking Locks.” The disclosure describes a lock with a rotating component that moves a latch bolt between retracted and extended positions. A trigger component attached to the rotating component works with two sensing components: one detects the position corresponding to the unlocked state, and the other detects the position corresponding to the locked state. Each sensor generates a signal when the trigger component reaches its designated position, enabling the lock to identify its state.

Career Highlights

Chang’s listed patent reflects work on sensing and control mechanisms for locks. The invention uses signals from sensors positioned to correspond with the lock’s locked and unlocked configurations.

Collaborations

Chang is associated with Anker Innovations Technology Co., Ltd. His listed coworkers include Junnan Li and Da Liang.

Conclusion

Dezhou Chang’s patent focuses on using position-based sensing signals to distinguish between locked and unlocked states, contributing to the development of lock-control technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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