San Jose, CA, United States of America

Devin Nguyen

USPTO Granted Patents = 9 

Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2017-2021

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9 patents (USPTO):

Title: The Innovative Contributions of Devin Nguyen

Introduction

Devin Nguyen is a prominent inventor based in San Jose, California. He has made significant contributions to the field of fluorescent microscopy and imaging technologies. With a total of nine patents to his name, Nguyen's work has advanced the capabilities of scientific instruments used in various research applications.

Latest Patents

Nguyen's latest patents include "Methods, systems and apparatuses for testing and calibrating fluorescent scanners." This invention discloses calibration apparatuses for fluorescent microscopy instruments and methods of making and using them. Specifically, the calibration apparatuses feature a fluorescent layer, such as photoresist, deposited on a substrate, with an optional layer of reflective material, such as chrome. The illumination of these layers, along with the detection and analysis of the resulting emissions, allows for the evaluation of the instrument concerning both reflective and fluorescent channels. The selection of appropriate fluorescent materials enables the evaluation of instruments with respect to different fluorophores, which is essential for two-color detection. Furthermore, the inclusion of a reflective layer allows for the calibration of all optical channels of an instrument, including the reflective channel and multiple fluorescent channels, using a single calibration apparatus.

Another notable patent is "Methods and devices for reading microarrays." This invention describes a method to image a probe array that includes focusing on a plurality of fiducials on the surface of an array. The method involves obtaining the optimal z position of the fiducials and employing a surface fitting algorithm to produce a surface fit profile. Adjustments to one or more surface non-flatness parameters can enhance the flatness image of the array surface to be imaged.

Career Highlights

Devin Nguyen is currently employed at Affymetrix, Inc., where he continues to innovate and develop advanced technologies in the field of microscopy and imaging. His work has been instrumental in improving the accuracy and efficiency of fluorescent scanning instruments.

Collaborations

Nguyen has collaborated with notable colleagues, including Chuan Gao and David Stern, contributing to the advancement of their shared research goals.

Conclusion

Devin Nguyen's innovative contributions to the field of fluorescent microscopy and imaging technologies have significantly impacted scientific research. His patents reflect a commitment to enhancing the capabilities of scientific instruments, making him a valuable figure in the world of invention.

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