The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
Apr. 03, 2019
Applicant:
Affymetrix, Inc., Carlsbad, CA (US);
Inventors:
David Stern, Mountain View, CA (US);
Chuan Gao, Sunnyvale, CA (US);
Melvin Yamamoto, Fremont, CA (US);
Devin Nguyen, San Jose, CA (US);
Assignee:
Affymetrix, Inc., Carlsbad, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 21/64 (2006.01); G02B 21/00 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00134 (2013.01); G01N 21/6452 (2013.01); G02B 21/008 (2013.01); G02B 21/0076 (2013.01); G02B 21/16 (2013.01); G02B 21/361 (2013.01); Y10T 29/49826 (2015.01);
Abstract
In one embodiment of the invention, a method to image a probe array is described that includes focusing on a plurality of fiducials on a surface of an array. The method utilizes obtaining the best z position of the fiducials and using a surface fitting algorithm to produce a surface fit profile. One or more surface non-flatness parameters can be adjusted to improve the flatness image of the array surface to be imaged.