Berlin, Germany

Detlef Ristau

This inventor holds 1 USPTO granted patent. Top assignee: Euro Emc Service Dr. Hansen Gmbh. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Detlef Ristau. Retrieved from https://idiyas.com/inventor/detlef-ristau-e9eh8o4i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Detlef Ristau and Electromagnetic Compatibility Testing

Introduction

Detlef Ristau is an inventor associated with Berlin, Germany. His patent work addresses methods and equipment for generating and receiving electromagnetic waves, particularly for electromagnetic compatibility testing.

Latest Patents

Ristau is credited with 1 patent: “Method and Apparatus for Generating and Receiving Electromagnetic Waves.” The invention describes a system for testing electromagnetic compatibility by exposing a test object to defined field parameters and measuring the electromagnetic radiation it emits. A distinguishing feature is a TEM-waveguide cell that rotates around the test object. Its pyramidal cell has electrically conductive top and bottom surfaces, with symmetrical, two-dimensional wire septa positioned near each surface.

Career Highlights

Ristau is associated with Euro EMC Service Dr. Hansen GmbH. His patent focuses on equipment for conducting measurements, investigations, and tests related to electromagnetic compatibility.

Collaborations

The supplied information identifies Diethard Hansen and Thomas Schreiber as Ristau’s coworkers.

Conclusion

Detlef Ristau’s documented invention contributes a rotating TEM-waveguide approach to electromagnetic compatibility testing and emission measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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