This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Industry-University Cooperation Foundation Hanyang University. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2021
Title: **Innovations by Deok Joong Kim: A Pioneer in Thickness Measurement Technology**
Introduction
Deok Joong Kim, an innovative inventor based in Seoul, South Korea, has made notable contributions to the field of thickness measurement technology. With a keen focus on enhancing measurement precision, he holds a patent that exemplifies his expertise and commitment to advancing technical applications.
Latest Patents
Kim's sole patent is titled "Thickness measurement apparatus, thickness measurement method, and thickness measurement program." This invention comprises a sophisticated thickness measuring device that utilizes terahertz wave technology. The device includes a terahertz wave signal processing unit designed to receive terahertz waves in both reflection and transmission modes. It also features a refractive index information acquisition unit that gathers critical refractive index data based on second-time difference information from reflected terahertz waves. Furthermore, a thickness information acquisition unit processes this data to determine the thickness of materials accurately.
Career Highlights
Currently, Deok Joong Kim works with the Industry-University Cooperation Foundation at Hanyang University, a reputable institution that fosters innovation and collaboration between academic research and industry applications. His role within this organization has positioned him at the forefront of technological development in measurement techniques.
Collaborations
Throughout his career, Kim has collaborated with esteemed colleagues, including Hak-Sung Kim and Gyung Hwan Oh. These professional relationships illustrate a shared commitment to innovation and the pursuit of excellence in the field of thickness measurements.
Conclusion
Deok Joong Kim's work stands as a testament to the impact of innovative thinking in the realm of measurement technology. His contributions not only enhance the accuracy of thickness measurements but also pave the way for further advancements in this critical area of research and application. As he continues to develop and refine his inventions, the industry can anticipate further breakthroughs that stem from his creative endeavors.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile