Seongnam, South Korea

Deok Hwa Kim

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Naver Labs Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Deok Hwa Kim. Retrieved from https://idiyas.com/inventor/deok-hwa-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 3.8

ph-index = 1


Company Filing History:


Years Active: 2024

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3 patents (USPTO):Explore Patents

Title: Deok Hwa Kim: Innovator in Visual Localization and 3D Mapping

Introduction

Deok Hwa Kim is a prominent inventor based in Seongnam-si, South Korea. He has made significant contributions to the fields of visual localization and three-dimensional mapping. With a total of 3 patents, his work is recognized for its innovative approaches and practical applications.

Latest Patents

Deok Hwa Kim's latest patents include a "Method and system for visual localization" and a "Method and system of generating 3D map." The visual localization method involves generating feature point maps from different viewpoints and integrating them for accurate localization. The 3D map generating method utilizes lidar and camera sensors to collect spatial and image data, estimating movement trajectories and creating 3D structure data based on the collected information.

Career Highlights

Deok Hwa Kim is currently employed at Naver Labs Corporation, where he continues to develop cutting-edge technologies. His work has positioned him as a key figure in the advancement of visual and spatial technologies.

Collaborations

He collaborates with talented coworkers, including Dong Hwan Lee and Woo Young Kim, contributing to a dynamic and innovative work environment.

Conclusion

Deok Hwa Kim's contributions to visual localization and 3D mapping demonstrate his commitment to innovation and technology. His patents reflect a deep understanding of spatial data and its applications in real-world scenarios.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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