Rimbach, Germany

Denys Maiier

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Carl Freudenberg Kg. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Denys Maiier. Retrieved from https://idiyas.com/inventor/denys-maiier

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Denys Maiier: Inventor of a Substrate-Identification Method

Introduction

Denys Maiier is an inventor associated with Rimbach, Germany, and Carl Freudenberg KG. His patent work includes a method for identifying the substrate on which a movable apparatus operates.

Latest Patents

Maiier is credited with 1 patent, titled “Method for Identifying the Substrate.” The invention uses an apparatus comprising a main body, a drive unit, a control unit, and a sensor assembly. As the apparatus moves on a substrate, the apparatus and substrate form a vibration system. The resulting vibration pattern varies according to the nature of the substrate. Sensors detect this pattern and send it to the control unit, which evaluates it to determine the substrate type.

Career Highlights

Maiier’s listed professional association is Carl Freudenberg KG. His patent describes a way for a movable apparatus to identify the surface beneath it by analyzing vibrations generated during operation.

Collaborations

The available information associates Maiier’s patent work with Carl Freudenberg KG. Further details about collaborators or the development process are not provided.

Conclusion

Denys Maiier’s patent presents a vibration-based approach to substrate identification, linking sensor measurements with control-unit analysis to determine the surface on which an apparatus moves.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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