Waxhaw, NC, United States of America

Dennis Wayne Kuntz

This inventor holds 1 USPTO granted patent. Top assignee: Amazon Technologies, Inc.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dennis Wayne Kuntz. Retrieved from https://idiyas.com/inventor/dennis-wayne-kuntz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Dennis Wayne Kuntz and Automated Vulnerability Chaining.

Introduction

Dennis Wayne Kuntz is an inventor associated with Waxhaw, North Carolina. His patent work addresses cybersecurity risk assessment, particularly how combinations of vulnerabilities can create greater risks than individual vulnerabilities considered separately.

Latest Patents

Kuntz is associated with 1 patent, titled “Automated Vulnerability Chaining.” The invention describes a vulnerability chaining engine that receives information about multiple vulnerabilities present on one or more hosts. It considers the vulnerabilities’ types and determines whether exploiting them in combination would create greater risk than their individual default scores indicate. The engine then assigns the vulnerabilities a higher chained risk score, helping represent the potential impact of their combined exploitation.

Career Highlights

Kuntz is associated with Amazon Technologies, Inc. His patent reflects work on improving how cybersecurity systems evaluate and prioritize interconnected vulnerabilities.

Collaborations

Matthew Block and Joshua Eugene Stevens are identified as Kuntz’s coworkers. Their shared professional context connects them to the broader technology and cybersecurity environment surrounding his work.

Conclusion

Dennis Wayne Kuntz’s “Automated Vulnerability Chaining” patent focuses on identifying elevated security risks that may arise when vulnerabilities are exploited together, rather than assessed only in isolation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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