Hyattsville, MD, United States of America

Dennis M Healy, Jr

This inventor holds 1 USPTO granted patent. Top assignee: University System of Maryland. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dennis M Healy, Jr. Retrieved from https://idiyas.com/inventor/dennis-m-healy-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Dennis M. Healy, Jr.: Radar Imaging Innovation.

Introduction

Dennis M. Healy, Jr. is an inventor associated with Hyattsville, Maryland, and the University System of Maryland. His patent work concerns compressive radar imaging, an approach designed to create images of targets using fewer transmitted and received electromagnetic waveforms.

Latest Patents

The supplied information identifies one patent associated with Healy: 1 patent, titled “Compressive Radar Imaging Technology.” The invention describes a method, apparatus, and computer-readable medium that use undersampling to produce a radar image of a target. The image is based on waveform measurements collected using a significantly reduced number of transmitted and received electromagnetic pulse waveforms.

Career Highlights

Healy’s listed work connects radar imaging research with the University System of Maryland. The patent’s focus on reducing the number of waveforms required for imaging highlights an effort to make radar data collection more efficient.

Collaborations

The supplied information names Vishal M. Patel and Ramalingam Chellappa as Healy’s coworkers. Their shared institutional association provides context for his research environment.

Conclusion

Dennis M. Healy, Jr.’s listed patent presents an undersampling-based approach to radar imaging that aims to form target images from fewer electromagnetic waveform measurements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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