Wheaton, IL, United States of America

Dennis I MacDonald

This inventor holds 1 USPTO granted patent. Top assignee: Nalco Chemical Company. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dennis I MacDonald. Retrieved from https://idiyas.com/inventor/dennis-i-macdonald

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 31(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Dennis I. MacDonald

Introduction

Dennis I. MacDonald is a notable inventor based in Wheaton, Illinois. He has made significant contributions to the field of paper manufacturing. His innovative approach has led to the development of a unique method for making paper.

Latest Patents

Dennis holds a patent for a "Method of Making Paper." This invention showcases his expertise and creativity in enhancing traditional paper production processes. His patent is a testament to his commitment to innovation in the industry.

Career Highlights

Dennis is currently employed at Nalco Chemical Company, where he applies his knowledge and skills to further advancements in chemical processes related to paper manufacturing. His work at Nalco has allowed him to explore new methodologies and improve existing practices.

Collaborations

Throughout his career, Dennis has collaborated with talented individuals such as Bruce A. Keiser and Maureen B. Nunn. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of innovative solutions.

Conclusion

Dennis I. MacDonald is a dedicated inventor whose work has significantly impacted the paper manufacturing industry. His patent and career at Nalco Chemical Company highlight his contributions to innovation and collaboration in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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