Dennis Harold Burke, Jr

Title: Dennis Harold Burke, Jr.: Semiconductor Testing Innovations

Introduction

Dennis Harold Burke, Jr. is an inventor based in Allen, Texas, whose work focuses on semiconductor testing systems. He is associated with Texas Instruments Corporation and holds 4 patents.

Latest Patents

Burke’s recent patent work addresses equipment maintenance and more efficient testing of semiconductor devices.

“Tester Having System Maintenance Compliance Tool” describes an automatic test equipment (ATE) tester module with sensors that detect maintenance triggers associated with test instruments. When a trigger is reported, the system can automatically block testing and identify required maintenance actions. Once those actions are completed, the equipment can be released for testing to resume.

“System and Method for Performing Concurrent Mixed Signal Testing on a Single Processor” describes a system for testing semiconductor devices, including mixed-signal devices. It prepares test-system elements for subsequent tests while current tests are running, and allows software modules to compute test results in parallel. Sharing test data through common storage helps separate complex computations from test execution and can improve testing efficiency.

Career Highlights

Burke’s listed inventions concern practical improvements to semiconductor test operations. One emphasizes maintenance compliance and equipment availability, while the other focuses on concurrent test preparation and parallel processing. Together, these approaches address reliability and efficiency in semiconductor testing.

Collaborations

Burke’s listed coworkers include Michael Lee Martel and Gunvant Patel. His work is associated with Texas Instruments Corporation.

Conclusion

Dennis Harold Burke, Jr.’s patent portfolio reflects a focus on improving semiconductor testing through automated maintenance controls and concurrent mixed-signal test processes.