Basingstoke, United Kingdom

Denis Senin

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Denis Senin. Retrieved from https://idiyas.com/inventor/denis-senin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Denis Senin - Innovator in Latency Measurement Technology

Introduction

Denis Senin is a notable inventor based in Basingstoke, GB. He has made significant contributions to the field of computer data storage, particularly in latency measurement during input/output operations. His innovative approach has implications for improving the efficiency of storage systems.

Latest Patents

Denis holds a patent for a method and a computer program product focused on latency measurement in I/O operations. This patent addresses how a storage system measures time periods taken in both write and read I/O operations. By monitoring delays caused by hosts and storage area networks, his invention enhances the performance of data storage systems. He has 1 patent to his name.

Career Highlights

Denis is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM allows him to collaborate with leading experts in the field and contribute to cutting-edge technology.

Collaborations

Denis has worked alongside notable colleagues such as Jonathan W L Short and Tim F McCarthy. Their combined expertise fosters an environment of innovation and advancement in technology.

Conclusion

Denis Senin's contributions to latency measurement in computer data storage exemplify the impact of innovative thinking in technology. His work continues to influence the efficiency of storage systems, showcasing the importance of advancements in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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