Longueuil, Canada

Denis Hardy

This inventor holds 1 USPTO granted patent. Top assignee: Pratt-Whitney Canada Corp. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Denis Hardy. Retrieved from https://idiyas.com/inventor/denis-hardy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Denis Hardy - Innovator in Manufacturing Technology

Introduction

Denis Hardy is a notable inventor based in Longueuil, Canada. He has made significant contributions to the field of manufacturing technology, particularly through his innovative patent that enhances the control of manufacturing machines.

Latest Patents

Denis Hardy holds a patent for a "Computer-implemented method of controlling a manufacturing machine, associated system and computer readable instructions." This method involves a controller that manages a manufacturing machine to execute specific manufacturing process steps for various features of a part. The process includes generating manufacturing data and associating it with identifiers in a non-transitory memory, thereby improving efficiency and accuracy in manufacturing.

Career Highlights

Denis Hardy is currently employed at Pratt & Whitney Canada Corp, where he applies his expertise in manufacturing technology. His work focuses on developing advanced methods that streamline manufacturing processes and enhance machine control.

Collaborations

Denis collaborates with talented colleagues such as Rachid Guiassa and Clément Drouin Laberge, contributing to innovative projects within the company.

Conclusion

Denis Hardy's contributions to manufacturing technology through his patent and work at Pratt & Whitney Canada Corp highlight his role as an influential inventor in the industry. His innovative methods are paving the way for advancements in manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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