Karlsruhe, Germany

Dengyang Fang

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Karlsruher Institut Für Technologie. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dengyang Fang. Retrieved from https://idiyas.com/inventor/dengyang-fang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Dengyang Fang: Inventor in Waveform Measurement

Introduction

Dengyang Fang is an inventor associated with Karlsruhe, Germany. His work includes a patent for a method and system for measuring arbitrary waveforms by detecting electromagnetic signals.

Latest Patents

Fang is associated with 1 patent, titled “Method for an Arbitrary Waveform Measurement and a System to Operate Said Method.” The invention describes detecting an electromagnetic use-signal by splitting it and a reference signal into corresponding partial signals, mixing those signals, digitizing the resulting partial mixing signals, and reconstructing the original use-signal through a transformation. At least one partial reference signal contains two or more spectral tones, while redundant information in the partial mixing signals helps determine a model parameter related to a measurement property.

Career Highlights

Fang is associated with the Karlsruhe Institute of Technology, also known in German as Karlsruher Institut für Technologie. The available information identifies this institution as part of his professional background.

Collaborations

Fang’s listed coworkers include Christian Koos and Daniel Drayss.

Conclusion

Dengyang Fang’s patent addresses waveform measurement through signal splitting, mixing, digitization, and reconstruction, reflecting his connection to research at the Karlsruhe Institute of Technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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