This inventor holds 1 USPTO granted patent and 10 published patent applications and 2 EPO patents. Top assignee: Contemporary Amperex Technology (Hong Kong) Limited. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: The Innovative Contributions of Dengwei Lian
Introduction
Dengwei Lian is a notable inventor based in Fujian, China. He has made significant contributions to the field of leak detection technologies. His innovative approach has led to the development of a unique method for box leak detection.
Latest Patents
Dengwei Lian holds a patent for a "Method for Box Leak Detection and Leak Detection System." This application provides a comprehensive method for detecting leaks in boxes. The method involves filling a box under test with a tracer gas and measuring the leak rate at various positions. This process allows for the identification of specific leak locations, enabling targeted leak-proof treatments. Additionally, it measures the leak rate at each position, which aids in determining the necessary leak-proof measures. This innovation significantly enhances the accuracy of box leak detection.
Career Highlights
Dengwei Lian is currently associated with Contemporary Amperex Technology (Hong Kong) Limited. His work at this company reflects his commitment to advancing leak detection technologies. His contributions have been instrumental in improving the reliability and efficiency of leak detection systems.
Collaborations
Dengwei Lian has collaborated with talented individuals such as Ning Zhang and Bin Zhao. Their teamwork has fostered an environment of innovation and creativity in their projects.
Conclusion
Dengwei Lian's contributions to leak detection technologies exemplify the impact of innovative thinking in engineering. His patent and work at Contemporary Amperex Technology highlight his dedication to improving industry standards. His efforts continue to pave the way for advancements in leak detection methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile