This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: Verkor. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Delphine Vidal: Innovator in Secondary Cell Inspection Technology
Introduction
Delphine Vidal is a prominent inventor based in Grenoble, France. She has made significant contributions to the field of secondary cell inspection technology. Her innovative approach has led to the development of a unique inspection apparatus that enhances the reliability and efficiency of secondary cell assessments.
Latest Patents
Delphine Vidal holds a patent for an "Apparatus and method for inspecting a secondary cell." This inspection apparatus includes a fixed support part, a movable part, and pressing parts that are installed between the support part and the movable part. The pressing parts are designed to be freely movable along the main axis, with two adjacent pressing parts defining a space for accommodating a secondary cell. Each pressing part that contacts the secondary cell is equipped with a temperature sensor, which measures the temperature of the cell under pressure. This innovative method significantly improves the inspection process for secondary cells.
Career Highlights
Delphine Vidal is currently employed at Verkor, a company focused on advancing battery technology. Her work at Verkor has positioned her as a key player in the development of innovative solutions for energy storage. With her expertise, she continues to drive advancements in the field.
Collaborations
Delphine collaborates with talented individuals such as Jeong Hyun Kim and Drew Heilman. These partnerships enhance her work and contribute to the innovative environment at Verkor.
Conclusion
Delphine Vidal's contributions to secondary cell inspection technology exemplify her commitment to innovation. Her patent and work at Verkor highlight her role as a leading inventor in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile