Beijing, China

Dehua Chen

This inventor holds 1 USPTO granted patent. Top assignees: Beijing Boe Display Technology Co., Ltd., Boe Technology Group Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dehua Chen. Retrieved from https://idiyas.com/inventor/dehua-chen-hns2u28l

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Dehua Chen in Display Technology

Introduction

Dehua Chen is a prominent inventor based in Beijing, China, known for his innovative contributions to display technology. With a focus on enhancing inspection methods, his work has paved the way for advancements in the manufacturing processes of display substrates. He holds one patent that exemplifies his commitment to innovation in this field.

Latest Patents

Dehua Chen's notable patent is titled "Inspection Device and Inspection System for Display Substrate." This invention features an advanced inspection device, which includes a support member, a turning table, and a first drive device. The turning table is equipped with a carrier that is pivotally mounted on a pivot shaft, featuring an observation aperture through its thickness. The positioning clamps mounted on the carrier securely hold the display substrate within the observation aperture's range. This design allows for omnidirectional inspections of the display substrate without direct contact, significantly reducing the risk of damage during assessments and minimizing defects caused by appearance inspections.

Career Highlights

Throughout his career, Dehua Chen has been affiliated with notable companies in the display technology sector. He has worked with BOE Technology Group Co., Ltd. and Beijing BOE Display Technology Co., Ltd., where he has contributed to developing innovative display solutions and enhancing inspection methodologies.

Collaborations

Dehua Chen has collaborated with talented professionals, including Yu Yang and Nanren Quan, who have also made significant contributions to the field. Their collective efforts have advanced inspection technologies and improved the quality assurance processes in display manufacturing.

Conclusion

Dehua Chen's contributions to the field of display technology, particularly through his patented inspection device, highlight the importance of innovation in ensuring product quality. As he continues to work alongside skilled colleagues, his influence in the industry is destined to grow, driving further advancements in inspection systems and overall display technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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