Lyngby, Denmark

Deepak Jain

This inventor holds 1 USPTO granted patent. Top assignee: Technical University of Denmark. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Deepak Jain. Retrieved from https://idiyas.com/inventor/deepak-jain-xu98gt0p

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Deepak Jain - Innovator in Optical Coherence Tomography

Introduction

Deepak Jain is a notable inventor based in Lyngby, Denmark. He has made significant contributions to the field of optical coherence tomography (OCT), particularly with a focus on mid-infrared systems. His work is recognized for its potential applications in various medical and industrial fields.

Latest Patents

Deepak Jain holds 1 patent for an Optical Coherence Tomography system. This patent discloses a mid-IR OCT system, which is designed to enhance imaging capabilities in various applications.

Career Highlights

Deepak Jain is affiliated with the Technical University of Denmark, where he continues to advance research in optical technologies. His academic background and innovative work have positioned him as a key figure in his field.

Collaborations

Throughout his career, Deepak has collaborated with notable colleagues, including Christos Markos and Christian Rosenberg Petersen. These partnerships have contributed to the development of cutting-edge technologies in optical coherence tomography.

Conclusion

Deepak Jain's contributions to the field of optical coherence tomography exemplify his innovative spirit and dedication to advancing technology. His work continues to inspire future developments in imaging systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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