Madison, WI, United States of America

Debra J Saez

This inventor holds 1 USPTO granted patent. Top assignee: Oxy Metal Industries Corporation. Active years: 1980.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Debra J Saez. Retrieved from https://idiyas.com/inventor/debra-j-saez

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1980

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1 patent (USPTO):Explore Patents

Title: Debra J Saez: Innovator in Electroplating Technology

Introduction

Debra J Saez is a notable inventor based in Madison, WI (US). She has made significant contributions to the field of electroplating, particularly with her innovative patent that addresses the challenges associated with traditional electroplating processes.

Latest Patents

Debra holds a patent for an "Electroplating bath and process." This invention features a non-cyanide zinc electroplating bath that includes a brightening and leveling agent, specifically a bath soluble butyl nicotinate sulfate or sulfonated quaternary salt. The electroplating bath is designed to enhance the quality of the electrodeposited zinc plate, achieving improved leveling over a broad pH range of about 2.0 to 7.5 and varying current densities.

Career Highlights

Debra is associated with Oxy Metal Industries Corporation, where she applies her expertise in electroplating technology. Her work has contributed to advancements in the manufacturing processes within the metal finishing industry.

Collaborations

Throughout her career, Debra has collaborated with notable colleagues, including Sylvia Martin and the late Hans G Creutz. These partnerships have fostered innovation and development in their respective fields.

Conclusion

Debra J Saez is a pioneering inventor whose work in electroplating technology has made a lasting impact on the industry. Her contributions continue to influence advancements in manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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