Dean G Percy

Title: Dean G Percy: Innovator in Integrated Circuit Testing

Introduction

Dean G Percy is a notable inventor based in Stowe, Vermont, who has made significant contributions to the field of integrated circuit testing. With a total of 2 patents to his name, Percy has developed innovative methods that enhance the efficiency and accuracy of semiconductor testing.

Latest Patents

Percy's latest patents include "Integrated circuit test optimization using adaptive test pattern sampling algorithm." This method involves performing baseline testing on a group of chips using a comprehensive set of test patterns. For chips identified as failing, a score is determined for each test pattern, indicating its effectiveness in identifying failing chips. Following this, streamlined testing is conducted on a second group of chips using a reduced set of the highest-scoring test patterns. The process alternates between streamlined and full testing for additional groups of chips to ensure thorough evaluation.

Another significant patent is "Temperature compensation in maximum frequency measurement and speed sort." This method addresses temperature sensitivity in semiconductor IC chips, particularly for maximum frequency measurement (Fmax). It involves measuring a temperature-sensitive parameter during testing, directly measuring the chip temperature, and adjusting the parameter based on these measurements to ensure accurate categorization of the chips.

Career Highlights

Dean G Percy is currently employed at International Business Machines Corporation (IBM), where he continues to innovate in the field of semiconductor technology. His work has been instrumental in advancing testing methodologies that improve the reliability of integrated circuits.

Collaborations

Percy has collaborated with notable colleagues, including Matthew Sean Grady and Mark C Johnson, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Dean G Percy stands out as a key figure in the realm of integrated circuit testing, with his patents reflecting a commitment to enhancing testing processes. His contributions to IBM and the field of semiconductor technology underscore the importance of innovation in driving advancements in this critical area.