This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Pusan National University. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: The Innovative Contributions of Dawoon Jeong
Introduction
Dawoon Jeong is a notable inventor based in Busan, South Korea. He has made significant strides in the field of optical measurement technology. His work focuses on developing advanced devices that enhance measurement accuracy and efficiency.
Latest Patents
Dawoon Jeong holds a patent for a "Dual spectral variable-based optical frequency scanning laser light source and measurement device using the same and object angle-dependent distance measurement device using propagation angle switching for each optical frequency." This innovative measurement device includes an optical gain unit for generating and amplifying light, a transmission optical band variation unit for selecting and varying specific optical frequency bands, and a resonant optical frequency variation unit that performs frequency variations. The device is designed to improve the precision of distance measurements by utilizing selective oscillation of light at specific resonant optical frequencies.
Career Highlights
Dawoon Jeong is affiliated with Pusan National University, where he contributes to research and development in optical technologies. His academic background and expertise have positioned him as a key figure in advancing measurement devices.
Collaborations
Dawoon collaborates with talented colleagues, including Changseok Kim and Hansol Jang, who contribute to his research endeavors. Their combined efforts enhance the innovation and effectiveness of their projects.
Conclusion
Dawoon Jeong's contributions to optical measurement technology exemplify the impact of innovative thinking in scientific research. His patent and collaborative efforts continue to push the boundaries of what is possible in measurement devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile