Sichuan, China

Dawei Shen

This inventor holds 1 USPTO granted patent. Top assignee: Chengdu Idealsee Technology Co., Ltd.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dawei Shen. Retrieved from https://idiyas.com/inventor/dawei-shen-d4mig489

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Dawei Shen: Innovator in Optical Fiber Technology

Introduction

Dawei Shen is a prominent inventor based in Sichuan, China. He has made significant contributions to the field of optical fiber technology. His innovative work has led to the development of advanced devices that enhance imaging and projection capabilities.

Latest Patents

Dawei Shen holds a patent for an optical fiber scanner and projection apparatus. This invention includes a housing that encloses an optical fiber, an actuator, and projection objective lenses. The optical fiber consists of a fiber core and an inner cladding. The design features an optical fiber cantilever that allows for unique focusing capabilities, enhancing the performance of projection systems.

Career Highlights

Dawei Shen is associated with Chengdu Idealsee Technology Co., Ltd., where he applies his expertise in optical technologies. His work has been instrumental in advancing the company's product offerings in the optical fiber domain.

Collaborations

He collaborates with talented coworkers, including Jiazhou Wang and Chao Chen, to drive innovation within the company. Their combined efforts contribute to the development of cutting-edge technologies in optical applications.

Conclusion

Dawei Shen's contributions to optical fiber technology exemplify the spirit of innovation. His patent and work at Chengdu Idealsee Technology Co., Ltd. highlight his role as a key player in advancing optical technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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