Milan, Italy

Davide Onofrio

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Kee Square S.r.l.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Davide Onofrio. Retrieved from https://idiyas.com/inventor/davide-onofrio-g1wxv44z

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Davide Onofrio: Innovator in Object Recognition Technology

Introduction

Davide Onofrio is a notable inventor based in Milan, Italy. He has made significant contributions to the field of image recognition technology. His innovative approach has led to the development of a unique method for recognizing objects through image analysis.

Latest Patents

Davide holds a patent for a method that facilitates recognition between a first object and a second object, each represented by images. This method involves defining rectangular assemblies of random pixels and filtering images with specific filters to obtain filtered matrices. The process includes classifying these matrices and comparing their characteristics to achieve accurate recognition.

Career Highlights

Davide Onofrio is currently associated with Kee Square S.r.l., where he applies his expertise in image processing and recognition technologies. His work has been instrumental in advancing the capabilities of object recognition systems.

Collaborations

Davide collaborates with Marco Marcon, contributing to innovative projects within their company. Their teamwork enhances the development of cutting-edge technologies in the field.

Conclusion

Davide Onofrio's contributions to image recognition technology exemplify his innovative spirit and dedication to advancing the field. His patent and work at Kee Square S.r.l. highlight his role as a key player in technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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