Kiryat-Gat, Israel

David Zaltsman

This inventor holds 1 USPTO granted patent. Top assignee: Intuit, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Zaltsman. Retrieved from https://idiyas.com/inventor/david-zaltsman

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: David Zaltsman: Data Repair and Database Reliability.

Introduction

David Zaltsman is an inventor based in Kiryat-Gat, Israel, whose patent work addresses data quality and database reliability. His listed invention concerns repairing target data by comparing changes in a source database with changes in a materialized target database.

Latest Patents

Zaltsman is credited with 1 patent: “Data Repair Based on Parity Determined Using Join Operation.” The invention describes systems and methods for repairing data by determining parity between an append-only source database and a target database containing a materialized version of that data.

A data quality management system generates datasets representing changes to both the source and target data between the current and a previous ingestion time. Comparing these datasets can establish parity for updated and inserted records. For deleted data, the system uses a join operation involving the target database and the source data change dataset. It then uses the resulting parity information to selectively repair the target data.

Career Highlights

Zaltsman is associated with Intuit Inc. His patent focuses on a practical challenge in data management: identifying and correcting inconsistencies between source records and their target representation.

Collaborations

His listed coworkers include Saikiran Sri Thunuguntla and Tal Sharon.

Conclusion

David Zaltsman’s patented work applies change comparison and join-based parity analysis to support selective data repair and improve consistency between databases.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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