South Kilworth, United Kingdom

David William Blair

This inventor holds 1 USPTO granted patent. Top assignee: Spiralock Corporation. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David William Blair. Retrieved from https://idiyas.com/inventor/david-william-blair

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 2003

Loading Chart...
1 patent (USPTO):Explore Patents

Title: David William Blair: Innovator of the Anti-Tamper Nut

Introduction

David William Blair is a notable inventor based in South Kilworth, GB. He has made significant contributions to the field of engineering with his innovative designs. His work primarily focuses on creating solutions that enhance security and functionality in mechanical applications.

Latest Patents

David holds a patent for an anti-tamper nut, which features a threaded bore and an angled outer surface. The design includes a plurality of ribs that extend from a first face to a second face of the nut. This unique configuration allows a wrench to mate with the outer surface of the nut, enabling it to be rotationally driven along the threads of a threaded member. This invention addresses the need for secure fastening solutions in various applications.

Career Highlights

David William Blair is associated with Spiralock Corporation, where he applies his expertise in developing innovative fastening solutions. His work at the company has contributed to advancements in the industry, particularly in creating products that enhance security and reliability.

Collaborations

(Section skipped due to space constraints.)

Conclusion

David William Blair's contributions to the field of invention, particularly with his anti-tamper nut, showcase his commitment to innovation and engineering excellence. His work continues to influence the industry and inspire future developments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…