Atlanta, GA, United States of America

David Wayne Roberts

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Georgia Tech Research Corporation. Active years: 2000-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Wayne Roberts. Retrieved from https://idiyas.com/inventor/david-wayne-roberts

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 1.6

ph-index = 2

Forward Citations = 27(Granted Patents)


Location History:

  • Atlanta, GA (US) (2000)
  • Smyrna, GA (US) (2014)

Company Filing History:


Years Active: 2000-2014

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2 patents (USPTO):Explore Patents

Title: Innovations by David Wayne Roberts

Introduction

David Wayne Roberts is an accomplished inventor based in Atlanta, GA. He has made significant contributions to the field of technology, particularly in the areas of radiation detection and retroreflectivity measurement. With a total of 2 patents, his work showcases innovative solutions to complex problems.

Latest Patents

One of his latest patents is focused on the remote detection of radiation. This invention provides a method for detecting inaccessible radiation sources by measuring corresponding ions and excited molecules created by radiation, utilizing LIDAR technology. The LIDAR system employs a pulsed laser transmitter, a telescope receiver, and associated control and acquisition systems. Light propagates from the laser transmitter into the volume surrounding the radioactive source, known as the 'ion cloud.' The ion cloud absorbs the transmitted light, inducing non-fluorescing ions to fluoresce. The backscattered light is then collected by the telescope receiver, and the intensity of the fluorescence is measured to indicate the number density of the ionized atoms. Algorithms can relate the measured ionization rates to the source activity.

Another notable patent by Roberts is a system and method for measuring the retroreflectivity of materials. This system comprises a light source and a first optical pathway along which an illumination light beam travels to a retroreflective surface. A second optical pathway is provided for the retroreflected beam traveling back to a sensor array. A processor, electrically coupled to the sensor array, determines the intensity of a predetermined pattern of the retroreflected beam, defining the retroreflected light propagating from the surface at a predetermined observation angle.

Career Highlights

David Wayne Roberts is affiliated with the Georgia Tech Research Corporation, where he continues to innovate and develop new technologies. His work has garnered attention for its practical applications and contributions to safety and measurement accuracy.

Collaborations

Roberts has collaborated with notable colleagues, including Bernd Kahn and Brent Karl Wagner, enhancing the impact of his inventions through teamwork and shared expertise.

Conclusion

David Wayne Roberts exemplifies the spirit of innovation through his patents and contributions to technology. His work in radiation detection and retroreflectivity measurement highlights the importance of advancing scientific understanding and practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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