Lake Forest Park, WA, United States of America

David Wayne Flynt

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Microsoft Technology Licensing, LLC. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Wayne Flynt. Retrieved from https://idiyas.com/inventor/david-wayne-flynt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: David Wayne Flynt: Innovator in User Interface Technology

Introduction

David Wayne Flynt is a notable inventor based in Lake Forest Park, Washington. He has made significant contributions to the field of technology, particularly in user interface design. His work is recognized for its impact on how users interact with digital displays.

Latest Patents

David Wayne Flynt holds 1 patent for a "Portion of a display screen showing a user interface." This patent showcases his innovative approach to enhancing user experience through improved interface design.

Career Highlights

Flynt is currently associated with Microsoft Technology Licensing, LLC, where he continues to develop and refine technologies that shape the future of user interfaces. His role at Microsoft highlights his commitment to advancing technology in meaningful ways.

Collaborations

Throughout his career, David has collaborated with talented individuals such as Rebecca Jo Sundling and Yin Zhu. These partnerships have allowed him to leverage diverse expertise and drive innovation in his projects.

Conclusion

David Wayne Flynt is a distinguished inventor whose work in user interface technology has made a lasting impact. His contributions continue to influence the way users engage with technology today.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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