US

David Wang

This inventor holds 0 USPTO granted patents, plus 11 CIPO patents.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Wang. Retrieved from https://idiyas.com/inventor/david-wang-zmu5i5v4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

 

Average Co-Inventor Count = 1.0

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Title: David Wang - Innovator in Automation and Control Systems

Introduction

David Wang is an accomplished inventor based in the United States. He has made significant contributions to the fields of automation and control systems. His innovative approaches have led to the development of advanced methods for monitoring and controlling equipment performance.

Latest Patents

David Wang holds two notable patents. The first is the "Automation Management System and Method," which discloses a method for monitoring the performance of tasks in controlled equipment. This method involves collecting a series of signals associated with tasks, comparing timing values to reference values, and generating predictive failure indications based on accumulated variance values. The second patent is for a "Distributed Control System," which outlines a method for controlling multiple machines. This method identifies prerequisite operating conditions for machines and performs operations based on current conditions.

Career Highlights

Throughout his career, David Wang has worked with several prominent companies, including Comau, Inc. and Epicenter, Incorporated. His experience in these organizations has allowed him to refine his skills and contribute to various innovative projects.

Collaborations

David has collaborated with notable coworkers, including Daisy Red and William J Godecker. Their teamwork has fostered an environment of creativity and innovation.

Conclusion

David Wang's contributions to automation and control systems demonstrate his expertise and commitment to innovation. His patents reflect a deep understanding of technology and its applications in real-world scenarios.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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