Slidell, LA, United States of America

David Wang

This inventor holds 1 USPTO granted patent. Top assignee: USA as Represented by Secretary of the Navy. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Wang. Retrieved from https://idiyas.com/inventor/david-wang-gzlnb3qv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: David Wang and Lidar-Based Bubble Detection

Introduction

David Wang is an inventor associated with Slidell, Louisiana, and the U.S. Navy. His patent work addresses the use of lidar to detect and characterize bubbles in moving water.

Latest Patents

Wang is associated with 1 patent, titled “Bubble Detection and Characterization via Lidar.” The method receives lidar data from remote sensing of moving water and calibrates it using contemporaneous measurements. It then refines the data by distinguishing signals associated with bubbles from non-bubble background signals. Using depolarization-ratio feature detection, the method determines a bubble mask and uses it to identify characteristics of bubbles in the water.

Career Highlights

The patent reflects work at the intersection of remote sensing, lidar data processing, and the study of moving water. Wang is associated with the U.S. Navy, formally represented in patent records as the United States of America as represented by the Secretary of the Navy.

Collaborations

The named coworkers associated with Wang include Damien Josset and Brian Concannon. Their inclusion indicates a connection to a broader group working on related technical efforts.

Conclusion

David Wang’s patent describes a lidar-based approach for separating bubble signals from background data and deriving bubble characteristics, highlighting an application of remote sensing to the analysis of moving water.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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