This inventor holds 1 USPTO granted patent. Top assignee: American Sigma, Inc.. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: David W Lyndaker: Innovator in Fluid Flow Measurement
Introduction
David W Lyndaker is a notable inventor based in Middleport, NY (US). He has made significant contributions to the field of fluid flow measurement through his innovative patent. His work focuses on enhancing the accuracy and efficiency of fluid flow calculations, which is crucial in various industrial applications.
Latest Patents
David holds a patent for a "Fluid flow measurement correcting system and methods of constructing and utilizing same." This invention features an apparatus designed to calculate fluid flow in a channel. It includes a very low profile probe that detects fluid depth, a mechanism for measuring average fluid velocity, and a system for correcting the detected fluid depth based on the measured average fluid velocity to account for drawdown. Additionally, it calculates the average flow rate using the average fluid velocity measurement and the corrected fluid depth value. The probe is designed with a height to width ratio of less than 0.52, making it highly efficient for its intended purpose. David has 1 patent to his name.
Career Highlights
David is currently associated with American Sigma, Inc., where he applies his expertise in fluid dynamics and measurement technologies. His role at the company allows him to further develop and refine his innovative ideas, contributing to advancements in the industry.
Collaborations
David has worked alongside talented colleagues, including Michael D Steen and John Liebe. Their collaborative efforts have likely fostered an environment of innovation and creativity, enhancing the development of new technologies.
Conclusion
David W Lyndaker is a dedicated inventor whose work in fluid flow measurement has the potential to impact various industries positively. His innovative patent showcases his commitment to improving measurement accuracy and efficiency.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile