Fayetteville, NY, United States of America

David Villarreal

This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: Welch Allyn, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Villarreal. Retrieved from https://idiyas.com/inventor/david-villarreal-x3ja6yrm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: David Villarreal: Inventor of an Optical Imaging Device.

Introduction

David Villarreal is an inventor based in Fayetteville, New York. His work includes a patented imaging device designed to capture and select images viewed through an optical viewing device. He is associated with Welch Allyn, Inc.

Latest Patents

Villarreal is credited with 1 patent, titled “Image Capture for Optical Viewing Devices.” The invention attaches to an optical viewing device using a bracket on its housing. It captures a sequence of images, assigns an image-quality score to each one, and selects a subset based on those scores. Users can review the selected images, choose one or more, and store their selections.

Career Highlights

Villarreal’s patent describes a practical approach to capturing and reviewing images through optical equipment. By evaluating image quality and presenting a selected subset, the device helps users identify images for storage.

Collaborations

Villarreal is associated with Welch Allyn, Inc. His listed coworker is Danielle R. Endres.

Conclusion

David Villarreal’s patented imaging device combines optical viewing, image-quality assessment, and user selection to support the capture and storage of useful images.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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