Barcelona, Spain

David Verde López

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Expert Ymaging, Sl.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Verde López. Retrieved from https://idiyas.com/inventor/david-verde-lópez

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: David Verde López: Innovator in Automated Parameter Calculation

Introduction

David Verde López is a notable inventor based in Barcelona, Spain. He has made significant contributions to the field of automated parameter calculation through his innovative methods and devices. With a focus on enhancing the accuracy and efficiency of object analysis, his work stands out in the realm of technology.

Latest Patents

David Verde López holds a patent for a "Method and device for automated parameters calculation of an object." This patent involves a sophisticated process that includes acquiring a two-dimensional image of an object using a camera, identifying the object within the image, and calculating various parameters such as size, dimensions, and weight. The method utilizes a model that links different parts and features of the object, ensuring precise measurements.

Career Highlights

Throughout his career, David has worked with several companies, including Expert Imaging, S.L. and Touchless Animal Metrics, S.L. His experience in these organizations has allowed him to refine his skills and contribute to advancements in imaging technology.

Collaborations

David has collaborated with talented individuals such as Ivan Amat Roldan and Iker Bilbao Aresté. These partnerships have fostered innovation and creativity in his projects.

Conclusion

David Verde López is a pioneering inventor whose work in automated parameter calculation has the potential to revolutionize object analysis. His contributions to technology and collaboration with other professionals highlight his commitment to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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