David Vaughnn

Title: Innovations of David Vaughnn

Introduction

David Vaughnn is a notable inventor based in Edina, MN (US), recognized for his contributions to optical inspection systems. With a total of seven patents to his name, Vaughnn has made significant advancements in the field of imaging technology.

Latest Patents

Among his latest patents is a focusing method and apparatus designed for placing wafers axially in an optical inspection system. This innovative method includes a series of through-focus images of a test wafer, which are acquired using the full field of view of the inspection optics. The process associates the value of the worst quality in each image with the respective axial location, forming a locus of 'worst' values as a function of axial location. The axial location is then optimized to provide the “best-worst” image quality. Additionally, his "video focus" method generates a series of through-focus images using a reduced field of view, allowing for calibration against the "best worst" focus. Another significant patent is the illuminator for darkfield inspection, which utilizes light from a single source divided among several illumination arms. This design ensures that the wafer is illuminated from multiple directions, enhancing the inspection process.

Career Highlights

David Vaughnn has worked with prominent companies in the industry, including Rudolph Technologies, Inc. and August Technology Corporation. His experience in these organizations has contributed to his expertise in optical inspection technologies.

Collaborations

Throughout his career, Vaughnn has collaborated with talented individuals such as Cory Watkins and Mark Harless, further enriching his innovative endeavors.

Conclusion

David Vaughnn's contributions to optical inspection systems through his patents and collaborations highlight his significant role in advancing imaging technology. His work continues to influence the field and inspire future innovations.