David VanValen

Title: David VanValen: Innovator in Non-Invasive Measurement Technologies

Introduction

David VanValen is an accomplished inventor based in Sunnyvale, CA. He has made significant contributions to the field of measurement technologies, particularly in the development of non-invasive instruments. His innovative approach has led to advancements that are both practical and essential for various applications.

Latest Patents

David holds a patent for a "Contactless or non-invasive physical properties measurement instrument using eddy current-reduced high Q resonant circuit probe." This technology focuses on eddy current measurement systems that cater to a variety of biometric and other applications. The design is particularly notable for its ability to minimize eddy current losses, which necessitates a very high Q tuned circuit probe. This innovation is aimed at creating ultra-miniature and ultra-low power products that are convenient, non-invasive, and intrinsically safe for wearable use.

Career Highlights

David is currently employed at Xtrava, Inc., where he continues to push the boundaries of measurement technology. His work has garnered attention for its potential to revolutionize how physical properties are measured in various fields.

Collaborations

David collaborates with talented individuals such as Sameh Sarhan and Lawrence Herbert Zuckerman, contributing to a dynamic and innovative work environment.

Conclusion

David VanValen's contributions to non-invasive measurement technologies exemplify the spirit of innovation. His work not only enhances the field of measurement but also paves the way for future advancements in wearable technology.