David V Gangl is an accomplished inventor based in Essex Junction, VT (US). He has made significant contributions to the field of embedded electronic devices, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

One of his latest patents is titled "System and method to predetermine a bitmap of a self-tested embedded array." This invention involves a built-in self-test (BIST) system designed for testing an array of embedded electronic devices. The BIST includes a shift register device that connects to an output pin of the device under test, generating a unique signature in response to failure indication signals. This method helps avoid the need to bitmap the array when a known failure signature is determined.

Another notable patent is the "Method and system for determining common failure modes for integrated circuits." This method applies a test pattern to the inputs of an integrated circuit device under test. The output data generated is then compared to expected data to determine if the test has passed. If the output data does not match, the system checks for a corresponding output signature and stores fail data if a match is found.

Career Highlights

David V Gangl is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to develop and refine his innovative ideas in the realm of electronic testing and diagnostics.

Collaborations

Throughout his career, David has collaborated with notable coworkers, including Matthew Sean Grady and David John Iverson. These collaborations have contributed to the advancement of technology in their respective fields.

Conclusion

David V Gangl's contributions to the field of embedded electronic devices through his patents reflect his dedication to innovation and technology. His work continues to influence the industry and pave the way for future advancements.